Publications wxEWA based upon

  • [ACR79] J.C.Ashley, J.J. Cowan, R.H.Ritchie, V.E. Anderson, J. Hoelzl, Straggling and plasmon excitation in the energy loss spectra of electrons transmitted through carbon. Thin Solid Films, 60 1979 pp 361-370
  • [AO-85] E.E. Aubanel, K. B. Oldham, Fourier smoothing without the Fast Fourier Transform. Byte, Feb 1985, pp 207-218.
  • [ATA87] G. B. Armen, J. Tulkki, T. Aberg and B. Crasemann, Quantum theory of post-collision interaction in inner-shell photoionization: Final state interaction between two continuum electrons. Phys. Rev. A36/12 1987 pp 5606-14.
  • [BH-81] H. E. Bishop, Practical Peak Area Measurements in X-Ray Photoelectron Spectroscopy. Surface and Interface Analysis 3 1981 p 272.
  • [BO-76] N. Beatham and A.F. Orchard, The application of Fourier transform techniques to the problem of deconvolution in photoelectron spectroscopy. J. Electron Spectr. and Rel. Phenom. 9 1976 pp 129-148.
  • [BPR69] P. R. Bevington, Data Reduction and Error Analysis for the Physical Sciences. McGraw-Hill, New York, 1969.
  • [BS-83] D. Briggs and M.P. Seah, Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy. Wiley & Sons, 1983.
  • [CL-91] J. Carrazza, V. Leon, A General and Simple Approach for the Determination of Energy Analyser Transmission Functions. Surf. Interf. Anal. 17 1991 pp 225-229.
  • [CPH31] P. H. van Cittert, Z. Physik, 69 1931 298.
  • [CSS96] Cumpson P. J., Seah M. P, Spencer S. J., Simple Procedure for precise Peak Maximum Estimation for Energy Calibration in AES and XPS. Surf. Interf. Anal. 24 1996 pp 687-694
  • [DHS88] W. A. Dench, L. B. Hazell, M. P. Seah, VAMAS Surface Chemical Analysis Standard Data Transfer Format with Skeleton Decoding Programs. NPL Report DMA(A)164, July 1988; Surf. Interf. Anal. 13 1988 pp 63-122.
  • [CS-92] P. J. Cumpson, M. P. Seah, Random uncertainties in AES and XPS. Uncertainties in peak energies, intensities and areas derived from peak synthesis. Surf. Interf. Anal. 18 1992 pp 345-367.
  • [DKS80] R. D. Deslattes, E. G. Kessler, W. C. Sauder and A. Henins, Remeasurement of Gamma-Ray Reference Lines. Annals of Physics, 129/2 1980 pp 378-434.
  • [DS-70] S. Doniach and M. Sunjic, J. Phys. C3 1970 285
    also G.K. Wertheim and S.B. Dicenzo, Least-squares analysis of photoemission data. J. Electron Spectr. and Rel. Phenom. 37 1985 pp 57-67.
  • [DSR76] S. R. Drayson, Rapid Computation of the Voigt profile. J. of Quant. Spectrosc. Radiat. Transfer 16 1976 pp 611-4.
  • [GP-72] P. Grujic, A classical calculation of e-H collisions ionization treshold law. J. Phys. B: Atom. Mol. Phys. 5 1972 pp L137-L139.
  • [HH-92] K. Harrison, L. B. Hazell, The determination of uncertainties in quatitative XPS/AES and its impact on data acquisition strategy. Surf. Interf. Anal. 18 1992 pp 368-376.
  • [JMW92] M. F. James, R. W. Mills, and D.R. Weawer, The use of the normalized residual in averaging experimental data and in treating outliers. Nucl. Instrum. Methods A313 1992 pp 277-282.
  • [KC-93] C. Klauber, Refinement of Magnesium and Aluminium K_alpha X-ray Source Functions. Surf. Interf. Anal. 20 1993 pp 703-715.
  • [KJ-73] J. K. Kielkopf, New approximation to the Voigt function with applications to spectral-line profile analysis. Journal of the Optical Society of America 63 1973 pp 987-995.
  • G. Leclerc and J.J. Pireaux: J. Electron Spectroscopy and Related Phenomena, 71(1995)141-164, The use of least squares for XPS peak parameters estimation.
    Part 1. Myths and realities J. Electron Spectrosc. and Relat. Phenom. 71 1995 pp 141-164.
    Part 2. Univariate hypothesis testing. J. Electron Spectrosc. and Relat. Phenom. 71 1995 pp 165-178.
    Part 3. Multicollinearity, ill-conditioning and constraint-induced bias. J. Electron Spectrosc. and Relat. Phenom. 71 1995 pp 179-190
  • [MH-78] H. H. Madden, Comments on the Savitzky-Golay Convolution Method for Least-Squares Fit Smoothing and Differentiation of Digital Data Anal. Chem. 50 1978 pp 1383-1386
  • [MJW73]Jörg W. Müller, Dead-time problems. Nucl. Instrum. Methods 112 1973 pp 47-57
  • [ML-68] L. Moore, Deconvolution of physical data. Brit. J. Appl. Phys. (J. Phys. D). 2/1 1968 pp 237-245.
  • [MNS98] S. Maehl, M. Neumann, V. Schlett, A.Baalmann, Some aspects of the Fitting of XPS Core Spectra of Polymers Surf. Interf. Anal. 26 1998 pp 204-212
  • [OL-77] J. J. Olivero and L. Longbothum, More precise approximation for the Voigt half width. J. of Quant. Spectrosc. Radiat.Transfer 17 1977 p 233
  • [OSA97] S. J. Osborne, S. Sundin, A. Ausmees, S. Svensson, L. J. Saethre, O. Svaeren, S. L. Sorensen, J. Végh, J. Karvonen, S. Aksela, A. Kikas, The vibrationally resolved C 1s core photoelectron spectra of methane and ethane J. Chem. Phys. 106/5 1997, pp.1661-1668
  • [PS-80] A. Proctor, P.M.A. Sherwood, Smoothing of Digital X-ray Photoelectron Spectra by an Extended Sliding Least-Squares Approach Anal. Chem. 52 1980 pp 2315-21
  • [PS-82] A. Procter and M. A. Sherwood, Data Analysis Techniques in X-Ray Photoelectron Spectroscopy Anal. Chem. 54 1982 p 13.
  • [PTV-92] W. H. Press, S. A. Teukolsky, W. T. Vetterling, B. P. Flannery, Numerical Recipes in C Cambridge Univ. Press, Cambridge 1992.
  • [RC-67] C. H. Reinsch, Smoothing by Spline Functions. Numerische Mathematik 10 1976 pp 177-183
  • [SD-72] D. A. Shirley, High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold. Phys. Rev. B55/12 1972 p 4709
  • [SDG88] M. P. Seah, W. A. Dench, B. Gale and T. E. Groves, Towards a single recommended optimal convolution smoothing algorithm for electron and other spectroscopies. J. Phys. E: Sci. Instrum. 351-63.
  • [SDM94] J. Schweppe, R. D. Deslattes, T. Mooney, and C. J. Powell, Accurate Measurement of Mg and Al alpha 1,2 X-ray Energy Profiles. J. Electron Spectroc. Relat. Phenom. 67 1994, p 463
  • [SF-92] F. Schreier, The Voigt and complex error function: a comparison of computational methods. J. of Quant. Spectrosc. Radiat. Transfer 48 1992 pp 743-762
  • [SG-64] A. Savitzky and M. J. Golay, Smoothing and differentiation of data. Anal. Chem. 36 1964 p 1627
  • [SMP90] M. P. Seah, Channel Electron Multipliers: Quantitative Intensity Measurement - efficiency, gain, linearity and bias effects J. Electron Spectroc. Relat. Phenom. 50 1990 pp 137-57
  • [SMP95] M. P. Seah, Effective Dead Time in Pulse Counting Systems Interf. Anal. 23 1995 pp 729-732
  • [ST-92] M. P. Seah, M. Tosa, Linearity in Electron Counting and Detection Systems. Surf. Interf. Anal. 18 1992 pp 240-246
  • [TB-92] B. C. H. Turton, A novel variant of the Savitzky-Golay filter for spectroscopic applications. Meas. Sci. Technol. 3 1992 pp 858-863
  • [TS-87]S. Tougaard, Solid. State. Commun. 61 1987 p 547;
    Quantitative Analysis of the Inelastic Background in Surface Electron Spectroscopy. Surf. Interf. Anal. 11 1988 p 453
  • [TS-89] S. Tougaard, Practical algorithm for background subtraction. Surface Science 216 1989 pp 343-360
  • [TS-97] S. Tougaard, Universality Classes of Inelastic Electron Scattering Cross-sections. Surf. Interf. Anal. 25 1997 pp 137-154
  • [VJ-88] J. Végh, The analytical form of the Shirley-type background. J. Electron Spectrosc. and Relat. Phenom. 46 1988 p 411
  • [VJ-93] J. Végh, Sloping Shirley-type Inelastic Line Shapes Surf. Interf. Anal. 20 1993 p 860
  • [VJ-99] J. Végh, Notes on locating peak energies in XPS Surf. Interf. Anal. 27 1999 pp 1114-1117
  • [VJ-03] J. Végh, The "carbon contamination" rule set implemented in an "embedded expert system" J. Electron Spectrosc. and Relat. Phenom. 133 2003 pp 87-101
  • [VJ-04a] J. Végh, A simple "embedded" reasoning inference engine with application example in the X-ray Photoelectron Spectroscopy Computer Physics Communications 160 2004 pp 8-22
  • [VJ-04b] J. Végh, The Shirley-equivalent electron scattering cross section function Surface Science 563 2004 pp 183-190
  • [WBW74] G. K. Wertheim, M. A. Butler, K. W. West and D. E. Buchanan, Determination of the Gaussian and Lorentzian content of experimental line shapes. Rev. Sci. Instrum. 45/11 1974 pp 1369-1371
  • [WGK75] G.K.Wertheim, Deconvolution and smoothing: applications in ESCA. J. Electron Spectrosc. and Relat. Phenom. 6 1975 pp 239-251
  • [WH-53] C. H. Wannier, The Treshold Law for Single Ionization of Atoms or Ions by Electrons. Phys. Rev.90 1953 pp 817-25